Geometrical analysis and pattern recognition using mapping technologies of three-dimensional fracture surfaces in materials.

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Title: Geometrical analysis and pattern recognition using mapping technologies of three-dimensional fracture surfaces in materials.
Authors: Tanaka, M., Kimura, Y., Kayama, A.
Source: Journal of Materials Science; December 2005, Vol. 40 Issue 23, p6291-6299, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501178557
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Geometrical analysis and pattern recognition using mapping technologies of three-dimensional fracture surfaces in materials.
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  Data: <searchLink fieldCode="AU" term="%22Tanaka%2C+M%2E%22">Tanaka, M.</searchLink><br /><searchLink fieldCode="AU" term="%22Kimura%2C+Y%2E%22">Kimura, Y.</searchLink><br /><searchLink fieldCode="AU" term="%22Kayama%2C+A%2E%22">Kayama, A.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%22">Journal of Materials Science</searchLink>; December 2005, Vol. 40 Issue 23, p6291-6299, 9p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501178557
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10853-005-3140-z
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 6291
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      – TitleFull: Geometrical analysis and pattern recognition using mapping technologies of three-dimensional fracture surfaces in materials.
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            NameFull: Tanaka, M.
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            NameFull: Kimura, Y.
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            NameFull: Kayama, A.
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            – D: 01
              M: 12
              Text: December 2005
              Type: published
              Y: 2005
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              Value: 40
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