A New Dynamic Gate Capacitance Measurement Protocol to Evaluate Integrated High-Voltage Devices' Switching Loss Performances in Power Management Applications.
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| Title: | A New Dynamic Gate Capacitance Measurement Protocol to Evaluate Integrated High-Voltage Devices' Switching Loss Performances in Power Management Applications. |
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| Authors: | Grelu, C., Baboux, N., Bianchi, R. A. |
| Source: | IEEE Transactions on Electron Devices; December 2005, Vol. 52 Issue 12, p2769-2775, 7p |
| Database: | Applied Science & Technology Source |
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