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Failure Mechanisms Associated With Lens Shape of High-Power LED Modules in Aging Test.

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Title: Failure Mechanisms Associated With Lens Shape of High-Power LED Modules in Aging Test.
Authors: Hsu, Yi-Cheng, Lin, Yu-Kuan, Chen, Ming-Hung
Source: IEEE Transactions on Electron Devices; February 2008, Vol. 55 Issue 2, p689-694, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501210312
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Failure Mechanisms Associated With Lens Shape of High-Power LED Modules in Aging Test.
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  Data: <searchLink fieldCode="AU" term="%22Hsu%2C+Yi-Cheng%22">Hsu, Yi-Cheng</searchLink><br /><searchLink fieldCode="AU" term="%22Lin%2C+Yu-Kuan%22">Lin, Yu-Kuan</searchLink><br /><searchLink fieldCode="AU" term="%22Chen%2C+Ming-Hung%22">Chen, Ming-Hung</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>; February 2008, Vol. 55 Issue 2, p689-694, 6p
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TED.2007.911905
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: 689
    Titles:
      – TitleFull: Failure Mechanisms Associated With Lens Shape of High-Power LED Modules in Aging Test.
        Type: main
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          Name:
            NameFull: Hsu, Yi-Cheng
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            NameFull: Lin, Yu-Kuan
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            NameFull: Chen, Ming-Hung
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            – D: 01
              M: 02
              Text: February 2008
              Type: published
              Y: 2008
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              Value: 55
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              Value: 2
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            – TitleFull: IEEE Transactions on Electron Devices
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