Yokota, Y., Mase, A., & Kogi, Y. (2008). Measurement of edge density profiles of Large Helical Device plasmas using an ultrashort-pulse reflectometer. Review of Scientific Instruments, 79(5), 056106. https://doi.org/10.1063/1.2917579
Chicago Style (17th ed.) CitationYokota, Y., A. Mase, and Y. Kogi. "Measurement of Edge Density Profiles of Large Helical Device Plasmas Using an Ultrashort-pulse Reflectometer." Review of Scientific Instruments 79, no. 5 (2008): 056106. https://doi.org/10.1063/1.2917579.
MLA (9th ed.) CitationYokota, Y., et al. "Measurement of Edge Density Profiles of Large Helical Device Plasmas Using an Ultrashort-pulse Reflectometer." Review of Scientific Instruments, vol. 79, no. 5, 2008, p. 056106, https://doi.org/10.1063/1.2917579.