APA (7th ed.) Citation

Rehse, S. J., Li, R., & Scholl, T. J. (2006). Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II. Canadian Journal of Physics, 84(8), 723. https://doi.org/10.1139/P06-063

Chicago Style (17th ed.) Citation

Rehse, S. J., R. Li, and T. J. Scholl. "Fast-ion-beam Laser-induced-fluorescence Measurements of Spontaneous-emission Branching Ratios and Oscillator Strengths in Sm II." Canadian Journal of Physics 84, no. 8 (2006): 723. https://doi.org/10.1139/P06-063.

MLA (9th ed.) Citation

Rehse, S. J., et al. "Fast-ion-beam Laser-induced-fluorescence Measurements of Spontaneous-emission Branching Ratios and Oscillator Strengths in Sm II." Canadian Journal of Physics, vol. 84, no. 8, 2006, p. 723, https://doi.org/10.1139/P06-063.