Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II.
Saved in:
| Title: | Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II. |
|---|---|
| Authors: | Rehse, S. J., Li, R., Scholl, T. J. |
| Source: | Canadian Journal of Physics; August 2006, Vol. 84 Issue 8, p723-771, 49p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 00084204 |
|---|---|
| DOI: | 10.1139/P06-063 |