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Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II.

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Title: Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II.
Authors: Rehse, S. J., Li, R., Scholl, T. J.
Source: Canadian Journal of Physics; August 2006, Vol. 84 Issue 8, p723-771, 49p
Database: Applied Science & Technology Source
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  Data: Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II.
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  Data: <searchLink fieldCode="AU" term="%22Rehse%2C+S%2E+J%2E%22">Rehse, S. J.</searchLink><br /><searchLink fieldCode="AU" term="%22Li%2C+R%2E%22">Li, R.</searchLink><br /><searchLink fieldCode="AU" term="%22Scholl%2C+T%2E+J%2E%22">Scholl, T. J.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Canadian+Journal+of+Physics%22">Canadian Journal of Physics</searchLink>; August 2006, Vol. 84 Issue 8, p723-771, 49p
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      – Type: doi
        Value: 10.1139/P06-063
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      – Code: eng
        Text: English
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        PageCount: 49
        StartPage: 723
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      – TitleFull: Fast-ion-beam laser-induced-fluorescence measurements of spontaneous-emission branching ratios and oscillator strengths in Sm II.
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            NameFull: Rehse, S. J.
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            NameFull: Li, R.
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            NameFull: Scholl, T. J.
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              Text: August 2006
              Type: published
              Y: 2006
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              Value: 84
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