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Theoretical Prediction and Experimental Measurement of the Degree of Cure of Anisotropic Conductive Films (ACFs) for Chip-On-Flex (COF) Applications.

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Title: Theoretical Prediction and Experimental Measurement of the Degree of Cure of Anisotropic Conductive Films (ACFs) for Chip-On-Flex (COF) Applications.
Authors: Chung, Chang-Kyu, Kwon, Yong-Min, Kim, Il
Source: Journal of Electronic Materials; October 2008, Vol. 37 Issue 10, p1580-1590, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501320667
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Theoretical Prediction and Experimental Measurement of the Degree of Cure of Anisotropic Conductive Films (ACFs) for Chip-On-Flex (COF) Applications.
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  Data: <searchLink fieldCode="AU" term="%22Chung%2C+Chang-Kyu%22">Chung, Chang-Kyu</searchLink><br /><searchLink fieldCode="AU" term="%22Kwon%2C+Yong-Min%22">Kwon, Yong-Min</searchLink><br /><searchLink fieldCode="AU" term="%22Kim%2C+Il%22">Kim, Il</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; October 2008, Vol. 37 Issue 10, p1580-1590, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501320667
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s11664-008-0507-3
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 1580
    Titles:
      – TitleFull: Theoretical Prediction and Experimental Measurement of the Degree of Cure of Anisotropic Conductive Films (ACFs) for Chip-On-Flex (COF) Applications.
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            NameFull: Chung, Chang-Kyu
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            NameFull: Kwon, Yong-Min
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            NameFull: Kim, Il
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            – D: 01
              M: 10
              Text: October 2008
              Type: published
              Y: 2008
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              Value: 37
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              Value: 10
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            – TitleFull: Journal of Electronic Materials
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