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A Variation-Tolerant Sub-200 mV 6-T Subthreshold SRAM.

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Bibliographic Details
Title: A Variation-Tolerant Sub-200 mV 6-T Subthreshold SRAM.
Authors: Zhai, Bo, Hanson, Scott, Blaauw, David
Source: IEEE Journal of Solid-State Circuits; October 2008, Vol. 43 Issue 10, p2338-2348, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501322658
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: A Variation-Tolerant Sub-200 mV 6-T Subthreshold SRAM.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Zhai%2C+Bo%22">Zhai, Bo</searchLink><br /><searchLink fieldCode="AU" term="%22Hanson%2C+Scott%22">Hanson, Scott</searchLink><br /><searchLink fieldCode="AU" term="%22Blaauw%2C+David%22">Blaauw, David</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Journal+of+Solid-State+Circuits%22">IEEE Journal of Solid-State Circuits</searchLink>; October 2008, Vol. 43 Issue 10, p2338-2348, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501322658
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/JSSC.2008.2001903
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 2338
    Titles:
      – TitleFull: A Variation-Tolerant Sub-200 mV 6-T Subthreshold SRAM.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Zhai, Bo
      – PersonEntity:
          Name:
            NameFull: Hanson, Scott
      – PersonEntity:
          Name:
            NameFull: Blaauw, David
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Text: October 2008
              Type: published
              Y: 2008
          Identifiers:
            – Type: issn-print
              Value: 00189200
          Numbering:
            – Type: volume
              Value: 43
            – Type: issue
              Value: 10
          Titles:
            – TitleFull: IEEE Journal of Solid-State Circuits
              Type: main
ResultId 1