View in EDS

A Variation-Tolerant Sub-200 mV 6-T Subthreshold SRAM.

Saved in:
Bibliographic Details
Title: A Variation-Tolerant Sub-200 mV 6-T Subthreshold SRAM.
Authors: Zhai, Bo, Hanson, Scott, Blaauw, David
Source: IEEE Journal of Solid-State Circuits; October 2008, Vol. 43 Issue 10, p2338-2348, 11p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first