APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2009). Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 28(1), 121. https://doi.org/10.1109/TCAD.2008.2009152

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 28, no. 1 (2009): 121. https://doi.org/10.1109/TCAD.2008.2009152.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 28, no. 1, 2009, p. 121, https://doi.org/10.1109/TCAD.2008.2009152.