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Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions.

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Bibliographic Details
Title: Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; January 2009, Vol. 28 Issue 1, p121-129, 9p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 501366294
AccessLevel: 2
PubType: Academic Journal
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        Value: 10.1109/TCAD.2008.2009152
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        Text: English
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        PageCount: 9
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      – TitleFull: Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions.
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              Text: January 2009
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