APA (7th ed.) Citation

Bowman, K. A., Tschanz, J. W., & Kim, N. S. (2009). Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance. IEEE Journal of Solid-State Circuits, 44(1), 49. https://doi.org/10.1109/JSSC.2008.2007148

Chicago Style (17th ed.) Citation

Bowman, Keith A., James W. Tschanz, and Nam Sung Kim. "Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance." IEEE Journal of Solid-State Circuits 44, no. 1 (2009): 49. https://doi.org/10.1109/JSSC.2008.2007148.

MLA (9th ed.) Citation

Bowman, Keith A., et al. "Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance." IEEE Journal of Solid-State Circuits, vol. 44, no. 1, 2009, p. 49, https://doi.org/10.1109/JSSC.2008.2007148.