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Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance.

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Bibliographic Details
Title: Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance.
Authors: Bowman, Keith A., Tschanz, James W., Kim, Nam Sung
Source: IEEE Journal of Solid-State Circuits; January 2009, Vol. 44 Issue 1, p49-63, 15p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501366878
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance.
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  Data: <searchLink fieldCode="AU" term="%22Bowman%2C+Keith+A%2E%22">Bowman, Keith A.</searchLink><br /><searchLink fieldCode="AU" term="%22Tschanz%2C+James+W%2E%22">Tschanz, James W.</searchLink><br /><searchLink fieldCode="AU" term="%22Kim%2C+Nam+Sung%22">Kim, Nam Sung</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Journal+of+Solid-State+Circuits%22">IEEE Journal of Solid-State Circuits</searchLink>; January 2009, Vol. 44 Issue 1, p49-63, 15p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501366878
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/JSSC.2008.2007148
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 15
        StartPage: 49
    Titles:
      – TitleFull: Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance.
        Type: main
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            NameFull: Bowman, Keith A.
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            NameFull: Tschanz, James W.
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            NameFull: Kim, Nam Sung
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            – D: 01
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              Text: January 2009
              Type: published
              Y: 2009
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              Value: 44
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            – TitleFull: IEEE Journal of Solid-State Circuits
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