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Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance.

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Bibliographic Details
Title: Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance.
Authors: Bowman, Keith A., Tschanz, James W., Kim, Nam Sung
Source: IEEE Journal of Solid-State Circuits; January 2009, Vol. 44 Issue 1, p49-63, 15p
Database: Applied Science & Technology Source
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