APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2009). Random Test Generation With Input Cube Avoidance. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 17(1), 45. https://doi.org/10.1109/TVLSI.2008.2001943

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Random Test Generation With Input Cube Avoidance." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 17, no. 1 (2009): 45. https://doi.org/10.1109/TVLSI.2008.2001943.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Random Test Generation With Input Cube Avoidance." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 17, no. 1, 2009, p. 45, https://doi.org/10.1109/TVLSI.2008.2001943.