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Random Test Generation With Input Cube Avoidance.

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Bibliographic Details
Title: Random Test Generation With Input Cube Avoidance.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; January 2009, Vol. 17 Issue 1, p45-54, 10p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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        Value: 10.1109/TVLSI.2008.2001943
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      – Code: eng
        Text: English
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      – TitleFull: Random Test Generation With Input Cube Avoidance.
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            NameFull: Pomeranz, Irith
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              Text: January 2009
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