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Random Test Generation With Input Cube Avoidance.

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Bibliographic Details
Title: Random Test Generation With Input Cube Avoidance.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; January 2009, Vol. 17 Issue 1, p45-54, 10p
Database: Applied Science & Technology Source
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