APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2009). Forward-Looking Reverse Order Fault Simulation for n-Detection Test Sets. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 28(9), 1424. https://doi.org/10.1109/TCAD.2009.2023193

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Forward-Looking Reverse Order Fault Simulation for N-Detection Test Sets." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 28, no. 9 (2009): 1424. https://doi.org/10.1109/TCAD.2009.2023193.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Forward-Looking Reverse Order Fault Simulation for N-Detection Test Sets." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 28, no. 9, 2009, p. 1424, https://doi.org/10.1109/TCAD.2009.2023193.