Forward-Looking Reverse Order Fault Simulation for n-Detection Test Sets.
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| Title: | Forward-Looking Reverse Order Fault Simulation for n-Detection Test Sets. |
|---|---|
| Authors: | Pomeranz, Irith, Reddy, Sudhakar M. |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; September 2009, Vol. 28 Issue 9, p1424-1428, 5p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501482192 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501482192 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TCAD.2009.2023193 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 1424 Titles: – TitleFull: Forward-Looking Reverse Order Fault Simulation for n-Detection Test Sets. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Pomeranz, Irith – PersonEntity: Name: NameFull: Reddy, Sudhakar M. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 09 Text: September 2009 Type: published Y: 2009 Identifiers: – Type: issn-print Value: 02780070 Numbering: – Type: volume Value: 28 – Type: issue Value: 9 Titles: – TitleFull: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems Type: main |
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