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Rapid identification of structural phases in combinatorial thin-film libraries using x-ray diffraction and non-negative matrix factorization.

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Bibliographic Details
Title: Rapid identification of structural phases in combinatorial thin-film libraries using x-ray diffraction and non-negative matrix factorization.
Authors: Long, C. J., Bunker, D., Li, X.
Source: Review of Scientific Instruments; October 2009, Vol. 80 Issue 10, p103902-1-103902-6, 6p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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        Value: 10.1063/1.3216809
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        Text: English
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        PageCount: 6
        StartPage: 103902-1
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      – TitleFull: Rapid identification of structural phases in combinatorial thin-film libraries using x-ray diffraction and non-negative matrix factorization.
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              Text: October 2009
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