Aoki, T., Kaneko, T., & Sakamoto, T. (2007). Photoluminescence of oxygen-passivated porous silicon analyzed by wideband quadrature frequency resolved spectroscopy. Journal of Materials Science: Materials in Electronics, 18(1), S201. https://doi.org/10.1007/s10854-007-9204-x
Chicago Style (17th ed.) CitationAoki, T., T. Kaneko, and T. Sakamoto. "Photoluminescence of Oxygen-passivated Porous Silicon Analyzed by Wideband Quadrature Frequency Resolved Spectroscopy." Journal of Materials Science: Materials in Electronics 18, no. 1 (2007): S201. https://doi.org/10.1007/s10854-007-9204-x.
MLA (9th ed.) CitationAoki, T., et al. "Photoluminescence of Oxygen-passivated Porous Silicon Analyzed by Wideband Quadrature Frequency Resolved Spectroscopy." Journal of Materials Science: Materials in Electronics, vol. 18, no. 1, 2007, p. S201, https://doi.org/10.1007/s10854-007-9204-x.