Lin, Y. W., Lai, Y., & Lin, Y. L. (2008). Tin Whisker Growth Induced by High Electron Current Density. Journal of Electronic Materials, 37(1), 17. https://doi.org/10.1007/s11664-007-0219-0
Chicago Style (17th ed.) CitationLin, Y. W., Yi-Shao Lai, and Y. L. Lin. "Tin Whisker Growth Induced by High Electron Current Density." Journal of Electronic Materials 37, no. 1 (2008): 17. https://doi.org/10.1007/s11664-007-0219-0.
MLA (9th ed.) CitationLin, Y. W., et al. "Tin Whisker Growth Induced by High Electron Current Density." Journal of Electronic Materials, vol. 37, no. 1, 2008, p. 17, https://doi.org/10.1007/s11664-007-0219-0.
Warning: These citations may not always be 100% accurate.