Tin Whisker Growth Induced by High Electron Current Density.
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| Title: | Tin Whisker Growth Induced by High Electron Current Density. |
|---|---|
| Authors: | Lin, Y. W., Lai, Yi-Shao, Lin, Y. L. |
| Source: | Journal of Electronic Materials; January 2008, Vol. 37 Issue 1, p17-22, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501530180 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Tin Whisker Growth Induced by High Electron Current Density. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Lin%2C+Y%2E+W%2E%22">Lin, Y. W.</searchLink><br /><searchLink fieldCode="AU" term="%22Lai%2C+Yi-Shao%22">Lai, Yi-Shao</searchLink><br /><searchLink fieldCode="AU" term="%22Lin%2C+Y%2E+L%2E%22">Lin, Y. L.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; January 2008, Vol. 37 Issue 1, p17-22, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501530180 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11664-007-0219-0 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 17 Titles: – TitleFull: Tin Whisker Growth Induced by High Electron Current Density. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lin, Y. W. – PersonEntity: Name: NameFull: Lai, Yi-Shao – PersonEntity: Name: NameFull: Lin, Y. L. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: January 2008 Type: published Y: 2008 Identifiers: – Type: issn-print Value: 03615235 Numbering: – Type: volume Value: 37 – Type: issue Value: 1 Titles: – TitleFull: Journal of Electronic Materials Type: main |
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