Tin Whisker Growth Induced by High Electron Current Density.

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Bibliographic Details
Title: Tin Whisker Growth Induced by High Electron Current Density.
Authors: Lin, Y. W., Lai, Yi-Shao, Lin, Y. L.
Source: Journal of Electronic Materials; January 2008, Vol. 37 Issue 1, p17-22, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501530180
AccessLevel: 2
PubType: Academic Journal
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  Data: Tin Whisker Growth Induced by High Electron Current Density.
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  Data: <searchLink fieldCode="AU" term="%22Lin%2C+Y%2E+W%2E%22">Lin, Y. W.</searchLink><br /><searchLink fieldCode="AU" term="%22Lai%2C+Yi-Shao%22">Lai, Yi-Shao</searchLink><br /><searchLink fieldCode="AU" term="%22Lin%2C+Y%2E+L%2E%22">Lin, Y. L.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; January 2008, Vol. 37 Issue 1, p17-22, 6p
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      – Type: doi
        Value: 10.1007/s11664-007-0219-0
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      – Code: eng
        Text: English
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        PageCount: 6
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      – TitleFull: Tin Whisker Growth Induced by High Electron Current Density.
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            NameFull: Lin, Y. W.
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            NameFull: Lai, Yi-Shao
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              Text: January 2008
              Type: published
              Y: 2008
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