APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2010). Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 18(2), 333. https://doi.org/10.1109/TVLSI.2008.2010216

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18, no. 2 (2010): 333. https://doi.org/10.1109/TVLSI.2008.2010216.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 18, no. 2, 2010, p. 333, https://doi.org/10.1109/TVLSI.2008.2010216.