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Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests.

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Title: Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; February 2010, Vol. 18 Issue 2, p333-337, 5p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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        Value: 10.1109/TVLSI.2008.2010216
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 333
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      – TitleFull: Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests.
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            NameFull: Pomeranz, Irith
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              Text: February 2010
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              Y: 2010
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