Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests.
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| Title: | Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests. |
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| Authors: | Pomeranz, Irith, Reddy, Sudhakar M. |
| Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems; February 2010, Vol. 18 Issue 2, p333-337, 5p |
| Database: | Applied Science & Technology Source |
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