APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2010). TOV: Sequential Test Generation by Ordering of Test Vectors. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 29(3), 454. https://doi.org/10.1109/TCAD.2010.2041985

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "TOV: Sequential Test Generation by Ordering of Test Vectors." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 29, no. 3 (2010): 454. https://doi.org/10.1109/TCAD.2010.2041985.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "TOV: Sequential Test Generation by Ordering of Test Vectors." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 29, no. 3, 2010, p. 454, https://doi.org/10.1109/TCAD.2010.2041985.