TOV: Sequential Test Generation by Ordering of Test Vectors.
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| Title: | TOV: Sequential Test Generation by Ordering of Test Vectors. |
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| Authors: | Pomeranz, Irith, Reddy, Sudhakar M. |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; March 2010, Vol. 29 Issue 3, p454-465, 12p |
| Database: | Applied Science & Technology Source |
| ISSN: | 02780070 |
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| DOI: | 10.1109/TCAD.2010.2041985 |
