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TOV: Sequential Test Generation by Ordering of Test Vectors.

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Title: TOV: Sequential Test Generation by Ordering of Test Vectors.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; March 2010, Vol. 29 Issue 3, p454-465, 12p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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AccessLevel: 2
PubType: Academic Journal
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        Value: 10.1109/TCAD.2010.2041985
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        Text: English
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        PageCount: 12
        StartPage: 454
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      – TitleFull: TOV: Sequential Test Generation by Ordering of Test Vectors.
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              Text: March 2010
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              Y: 2010
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