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TOV: Sequential Test Generation by Ordering of Test Vectors.

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Bibliographic Details
Title: TOV: Sequential Test Generation by Ordering of Test Vectors.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; March 2010, Vol. 29 Issue 3, p454-465, 12p
Database: Applied Science & Technology Source
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