APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2010). On Test Generation With Test Vector Improvement. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 29(3), 502. https://doi.org/10.1109/TCAD.2010.2041853

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "On Test Generation With Test Vector Improvement." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 29, no. 3 (2010): 502. https://doi.org/10.1109/TCAD.2010.2041853.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "On Test Generation With Test Vector Improvement." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 29, no. 3, 2010, p. 502, https://doi.org/10.1109/TCAD.2010.2041853.