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Hierarchical planarity testing algorithms.

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Bibliographic Details
Title: Hierarchical planarity testing algorithms.
Authors: Lengauer, Thomas
Source: Journal of the ACM; July 1989, Vol. 36, p474-509, 36p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501663350
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Hierarchical planarity testing algorithms.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Lengauer%2C+Thomas%22">Lengauer, Thomas</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+the+ACM%22">Journal of the ACM</searchLink>; July 1989, Vol. 36, p474-509, 36p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501663350
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1145/65950.65952
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 36
        StartPage: 474
    Titles:
      – TitleFull: Hierarchical planarity testing algorithms.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Lengauer, Thomas
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: July 1989
              Type: published
              Y: 1989
          Identifiers:
            – Type: issn-print
              Value: 00045411
          Numbering:
            – Type: volume
              Value: 36
          Titles:
            – TitleFull: Journal of the ACM
              Type: main
ResultId 1