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Temperature-Dependent RF Small-Signal and Noise Characteristics of SOI Dynamic Threshold Voltage MOSFETs.

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Bibliographic Details
Title: Temperature-Dependent RF Small-Signal and Noise Characteristics of SOI Dynamic Threshold Voltage MOSFETs.
Authors: Wang, Sheng-Chun, Su, Pin, Chen, Kun-Ming
Source: IEEE Transactions on Microwave Theory & Techniques; September 2010, Vol. 58 Issue 9, p2319-2325, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501665692
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="AU" term="%22Wang%2C+Sheng-Chun%22">Wang, Sheng-Chun</searchLink><br /><searchLink fieldCode="AU" term="%22Su%2C+Pin%22">Su, Pin</searchLink><br /><searchLink fieldCode="AU" term="%22Chen%2C+Kun-Ming%22">Chen, Kun-Ming</searchLink>
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TMTT.2010.2057175
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 2319
    Titles:
      – TitleFull: Temperature-Dependent RF Small-Signal and Noise Characteristics of SOI Dynamic Threshold Voltage MOSFETs.
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            NameFull: Wang, Sheng-Chun
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            NameFull: Su, Pin
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            NameFull: Chen, Kun-Ming
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            – D: 01
              M: 09
              Text: September 2010
              Type: published
              Y: 2010
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              Value: 58
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