Pomeranz, I., & Reddy, S. M. (2010). Selection of a Fault Model for Fault Diagnosis Based on Unique Responses. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 18(11), 1533. https://doi.org/10.1109/TVLSI.2009.2025503
Chicago Style (17th ed.) CitationPomeranz, Irith, and Sudhakar M. Reddy. "Selection of a Fault Model for Fault Diagnosis Based on Unique Responses." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18, no. 11 (2010): 1533. https://doi.org/10.1109/TVLSI.2009.2025503.
MLA (9th ed.) CitationPomeranz, Irith, and Sudhakar M. Reddy. "Selection of a Fault Model for Fault Diagnosis Based on Unique Responses." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 18, no. 11, 2010, p. 1533, https://doi.org/10.1109/TVLSI.2009.2025503.