Selection of a Fault Model for Fault Diagnosis Based on Unique Responses.
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| Title: | Selection of a Fault Model for Fault Diagnosis Based on Unique Responses. |
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| Authors: | Pomeranz, Irith, Reddy, Sudhakar M. |
| Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems; November 2010, Vol. 18 Issue 11, p1533-1543, 11p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501706033 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501706033 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TVLSI.2009.2025503 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 1533 Titles: – TitleFull: Selection of a Fault Model for Fault Diagnosis Based on Unique Responses. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Pomeranz, Irith – PersonEntity: Name: NameFull: Reddy, Sudhakar M. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 11 Text: November 2010 Type: published Y: 2010 Identifiers: – Type: issn-print Value: 10638210 Numbering: – Type: volume Value: 18 – Type: issue Value: 11 Titles: – TitleFull: IEEE Transactions on Very Large Scale Integration (VLSI) Systems Type: main |
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