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Yield-Driven Near-Threshold SRAM Design.

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Bibliographic Details
Title: Yield-Driven Near-Threshold SRAM Design.
Authors: Chen, Gregory, Sylvester, Dennis, Blaauw, David
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; November 2010, Vol. 18 Issue 11, p1590-1598, 9p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 501706120
AccessLevel: 2
PubType: Academic Journal
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        Value: 10.1109/TVLSI.2009.2025766
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        Text: English
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            NameFull: Chen, Gregory
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              Text: November 2010
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