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Yield-Driven Near-Threshold SRAM Design.

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Bibliographic Details
Title: Yield-Driven Near-Threshold SRAM Design.
Authors: Chen, Gregory, Sylvester, Dennis, Blaauw, David
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; November 2010, Vol. 18 Issue 11, p1590-1598, 9p
Database: Applied Science & Technology Source
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