APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2011). Input Necessary Assignments for Testing of Path Delay Faults in Standard-Scan Circuits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 19(2), 333. https://doi.org/10.1109/TVLSI.2009.2031865

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Input Necessary Assignments for Testing of Path Delay Faults in Standard-Scan Circuits." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19, no. 2 (2011): 333. https://doi.org/10.1109/TVLSI.2009.2031865.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Input Necessary Assignments for Testing of Path Delay Faults in Standard-Scan Circuits." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 19, no. 2, 2011, p. 333, https://doi.org/10.1109/TVLSI.2009.2031865.