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Slow response and Eu2+-related trapping states in CaS:Eu thin-film electroluminescent devices.

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Bibliographic Details
Title: Slow response and Eu2+-related trapping states in CaS:Eu thin-film electroluminescent devices.
Authors: Ando, M., Abe, Y., Ono, Y. A.
Source: Journal of Applied Physics; November 1 1991, Vol. 70, p5018-5024, 7p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501940234
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Slow response and Eu2+-related trapping states in CaS:Eu thin-film electroluminescent devices.
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  Data: <searchLink fieldCode="AU" term="%22Ando%2C+M%2E%22">Ando, M.</searchLink><br /><searchLink fieldCode="AU" term="%22Abe%2C+Y%2E%22">Abe, Y.</searchLink><br /><searchLink fieldCode="AU" term="%22Ono%2C+Y%2E+A%2E%22">Ono, Y. A.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; November 1 1991, Vol. 70, p5018-5024, 7p
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.349006
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 7
        StartPage: 5018
    Titles:
      – TitleFull: Slow response and Eu2+-related trapping states in CaS:Eu thin-film electroluminescent devices.
        Type: main
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            NameFull: Ando, M.
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            NameFull: Abe, Y.
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            NameFull: Ono, Y. A.
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            – D: 01
              M: 11
              Text: November 1 1991
              Type: published
              Y: 1991
          Identifiers:
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              Value: 70
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            – TitleFull: Journal of Applied Physics
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