APA (7th ed.) Citation

Benson, T. M., Kendall, P. C., & Stern, M. S. (1988). Microwave simulation of optoelectronic bending loss in presence of dielectric discontinuity. IEE Proceedings. Part J, Optoelectronics., 135, 325. https://doi.org/10.1049/ip-j.1988.0061

Chicago Style (17th ed.) Citation

Benson, T. M., P. C. Kendall, and M. S. Stern. "Microwave Simulation of Optoelectronic Bending Loss in Presence of Dielectric Discontinuity." IEE Proceedings. Part J, Optoelectronics. 135 (1988): 325. https://doi.org/10.1049/ip-j.1988.0061.

MLA (9th ed.) Citation

Benson, T. M., et al. "Microwave Simulation of Optoelectronic Bending Loss in Presence of Dielectric Discontinuity." IEE Proceedings. Part J, Optoelectronics., vol. 135, 1988, p. 325, https://doi.org/10.1049/ip-j.1988.0061.