APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2011). Static Test Data Volume Reduction Using Complementation or Modulo-M Addition. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 19(6), 1108. https://doi.org/10.1109/TVLSI.2010.2044819

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Static Test Data Volume Reduction Using Complementation or Modulo-M Addition." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19, no. 6 (2011): 1108. https://doi.org/10.1109/TVLSI.2010.2044819.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Static Test Data Volume Reduction Using Complementation or Modulo-M Addition." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 19, no. 6, 2011, p. 1108, https://doi.org/10.1109/TVLSI.2010.2044819.