Static Test Data Volume Reduction Using Complementation or Modulo-M Addition.

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Bibliographic Details
Title: Static Test Data Volume Reduction Using Complementation or Modulo-M Addition.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; June 2011, Vol. 19 Issue 6, p1108-1112, 5p
Database: Applied Science & Technology Source
Description
ISSN:10638210
DOI:10.1109/TVLSI.2010.2044819