APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2011). Broadside and Functional Broadside Tests for Partial-Scan Circuits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 19(6), 1104. https://doi.org/10.1109/TVLSI.2010.2044049

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Broadside and Functional Broadside Tests for Partial-Scan Circuits." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19, no. 6 (2011): 1104. https://doi.org/10.1109/TVLSI.2010.2044049.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Broadside and Functional Broadside Tests for Partial-Scan Circuits." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 19, no. 6, 2011, p. 1104, https://doi.org/10.1109/TVLSI.2010.2044049.