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Broadside and Functional Broadside Tests for Partial-Scan Circuits.

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Title: Broadside and Functional Broadside Tests for Partial-Scan Circuits.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; June 2011, Vol. 19 Issue 6, p1104-1108, 5p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 502039358
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=502039358
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        Value: 10.1109/TVLSI.2010.2044049
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        Text: English
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        PageCount: 5
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      – TitleFull: Broadside and Functional Broadside Tests for Partial-Scan Circuits.
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            NameFull: Pomeranz, Irith
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              Text: June 2011
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              Y: 2011
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