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Broadside and Functional Broadside Tests for Partial-Scan Circuits.

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Bibliographic Details
Title: Broadside and Functional Broadside Tests for Partial-Scan Circuits.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; June 2011, Vol. 19 Issue 6, p1104-1108, 5p
Database: Applied Science & Technology Source
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