APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2011). On Functional Broadside Tests With Functional Propagation Conditions. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 19(6), 1094. https://doi.org/10.1109/TVLSI.2010.2043695

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "On Functional Broadside Tests With Functional Propagation Conditions." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19, no. 6 (2011): 1094. https://doi.org/10.1109/TVLSI.2010.2043695.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "On Functional Broadside Tests With Functional Propagation Conditions." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 19, no. 6, 2011, p. 1094, https://doi.org/10.1109/TVLSI.2010.2043695.