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On Functional Broadside Tests With Functional Propagation Conditions.

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Bibliographic Details
Title: On Functional Broadside Tests With Functional Propagation Conditions.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; June 2011, Vol. 19 Issue 6, p1094-1098, 5p
Database: Applied Science & Technology Source
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