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Minority carrier storage effect in the collector region and the storage time of transistors.

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Bibliographic Details
Title: Minority carrier storage effect in the collector region and the storage time of transistors.
Authors: Yanai, H.
Source: Proceedings of the IEEE; March 1964, Vol. 52, p312-314, 3p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 516176197
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Minority carrier storage effect in the collector region and the storage time of transistors.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Yanai%2C+H%2E%22">Yanai, H.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Proceedings+of+the+IEEE%22">Proceedings of the IEEE</searchLink>; March 1964, Vol. 52, p312-314, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=516176197
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/PROC.1964.2890
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 3
        StartPage: 312
    Titles:
      – TitleFull: Minority carrier storage effect in the collector region and the storage time of transistors.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Yanai, H.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 03
              Text: March 1964
              Type: published
              Y: 1964
          Identifiers:
            – Type: issn-print
              Value: 00189219
          Numbering:
            – Type: volume
              Value: 52
          Titles:
            – TitleFull: Proceedings of the IEEE
              Type: main
ResultId 1