Analysis of temperature field in chip.
Saved in:
| Title: | Analysis of temperature field in chip. |
|---|---|
| Authors: | Friedman, M. Y., Lenz, E. |
| Source: | Journal of Engineering for Industry; February 1973, Vol. 95, p317-320, 4p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 516616380 AccessLevel: 2 PubType: Periodical PubTypeId: serialPeriodical PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Analysis of temperature field in chip. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Friedman%2C+M%2E+Y%2E%22">Friedman, M. Y.</searchLink><br /><searchLink fieldCode="AU" term="%22Lenz%2C+E%2E%22">Lenz, E.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Engineering+for+Industry%22">Journal of Engineering for Industry</searchLink>; February 1973, Vol. 95, p317-320, 4p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=516616380 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 317 Titles: – TitleFull: Analysis of temperature field in chip. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Friedman, M. Y. – PersonEntity: Name: NameFull: Lenz, E. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: February 1973 Type: published Y: 1973 Identifiers: – Type: issn-print Value: 00220817 Numbering: – Type: volume Value: 95 Titles: – TitleFull: Journal of Engineering for Industry Type: main |
| ResultId | 1 |
